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2012 IEEE Custom Integrated Circuits Conference (CICC 2012) : San Jose, California, USA, 9 - 12 September 2012

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Guest Editorial - Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

S IGNAL integrity has become one of the most critical issues in deep submicrometer (DSM) design today. It refers to a general requirement that signals in digital and mixed-signal circuits remain within some specified margins and are tolerant to noise of any kind, so as to minimize data errors. With the continuous reduction of feature size and the consequent explosion of circuit complexity, it h...